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dc.contributor.authorBowers, Carleen Morris
dc.contributor.authorLiao, Kung-ching
dc.contributor.authorZaba, Tomasz
dc.contributor.authorRappoport, Dmitrij
dc.contributor.authorBaghbanzadeh, Mostafa
dc.contributor.authorBreiten, Benjamin
dc.contributor.authorKrzykawska, Anna
dc.contributor.authorCyganik, Piotr
dc.contributor.authorWhitesides, George McClelland
dc.date.accessioned2016-01-29T22:03:27Z
dc.date.issued2015
dc.identifierQuick submit: 2015-12-18T14:02:48-05:00
dc.identifier.citationBowers, Carleen M., Kung-Ching Liao, Tomasz Zaba, Dmitrij Rappoport, Mostafa Baghbanzadeh, Benjamin Breiten, Anna Krzykawska, Piotr Cyganik, and George M. Whitesides. 2015. “Characterizing the Metal–SAM Interface in Tunneling Junctions.” ACS Nano 9 (2) (February 24): 1471–1477. doi:10.1021/nn5059216.en_US
dc.identifier.issn1936-0851en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:24981607
dc.description.abstracthis paper investigates the influence of the interface between a gold or silver metal electrode and an n-alkyl SAM (supported on that electrode) on the rate of charge transport across junctions with structure Met(Au or Ag)TS/A(CH2)nH//Ga2O3/EGaIn by comparing measurements of current density, J(V), for Met/AR = Au/thiolate (Au/SR), Ag/thiolate (Ag/SR), Ag/carboxylate (Ag/O2CR), and Au/acetylene (Au/C≡CR), where R is an n-alkyl group. Values of J0 and β (from the Simmons equation) were indistinguishable for these four interfaces. Since the anchoring groups, A, have large differences in their physical and electronic properties, the observation that they are indistinguishable in their influence on the injection current, J0 (V = 0.5) indicates that these four Met/A interfaces do not contribute to the shape of the tunneling barrier in a way that influences J(V).en_US
dc.description.sponsorshipChemistry and Chemical Biologyen_US
dc.language.isoen_USen_US
dc.publisherAmerican Chemical Society (ACS)en_US
dc.relation.isversionofdoi:10.1021/nn5059216en_US
dash.licenseOAP
dc.titleCharacterizing the Metal–SAM Interface in Tunneling Junctionsen_US
dc.typeJournal Articleen_US
dc.date.updated2015-12-18T19:02:49Z
dc.description.versionAccepted Manuscripten_US
dc.rights.holderBowers, C. M Liao, K. C Zaba, T Rappoport, D Baghbanzadeh, M Breiten, B Krzykawska, A Cyganik, P Whitesides, G. M
dc.relation.journalACS Nanoen_US
dash.depositing.authorWhitesides, George McClelland
dc.date.available2016-01-29T22:03:27Z
dc.identifier.doi10.1021/nn5059216*
dash.contributor.affiliatedLiao, Kung-ching
dash.contributor.affiliatedRappoport, Dmitrij
dash.contributor.affiliatedBowers, Carleen
dash.contributor.affiliatedBaghbanzadeh, Mostafa
dash.contributor.affiliatedWhitesides, George
dc.identifier.orcid0000-0001-9451-2442


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